Evaluation of NF3 versus dimethylhydrazine as N sources for GaAsN
نویسندگان
چکیده
منابع مشابه
Remote plasma sources sustained in NF3 mixtures
Remote plasma sources (RPS) are being developed for low damage materials processing during semiconductor fabrication. Plasmas sustained in NF3 are often used as a source of F atoms. NF3 containing gas mixtures (e.g., NF3/O2, NF3/H2) provide the additional opportunity to produce and control desirable F atom containing reactive species. In this paper, results from computational investigations of ...
متن کاملInsights to scaling remote plasma sources sustained in NF3 mixtures
Remote plasma sources (RPSs) are being developed for low damage materials processing during semiconductor fabrication. Plasmas sustained in NF3 are often used as a source of F atoms. NF3 containing gas mixtures such as NF3/O2 and NF3/H2 provide additional opportunities to produce and control desirable reactive species such as F and NO. In this paper, results from computational investigations of...
متن کاملThe Incorporation of In in GaAsN as a Means of N Fraction Calibration
InGaAsN and GaAsN epitaxial layers with similar nitrogen compositions in a sample were successfully grown on a GaAs (001) substrate by solid source molecular beam epitaxy. An electron cyclotron resonance nitrogen plasma source has been used to generate atomic nitrogen during the growth of the nitride layers. The indium composition changed from sample to sample to give compressive and tensile st...
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ژورنال
عنوان ژورنال: Journal of Crystal Growth
سال: 2002
ISSN: 0022-0248
DOI: 10.1016/s0022-0248(01)01712-2